Nanocantilever signal transduction by electron transfer

被引:12
作者
Datskos, PG [1 ]
Thundat, T
机构
[1] Oak Ridge Natl Lab, Div Life Sci, Oak Ridge, TN 37831 USA
[2] Univ Tennessee, Knoxville, TN 37996 USA
关键词
nanocantilevers; resonance frequency; focused ion beam; micromachining; electron transfer;
D O I
10.1166/jnn.2002.091
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Microfabricated cantilever beams promise to bring about a revolution in the field of chemical, physical, and biological sensor development. The resonance frequency of a microfabricated cantilever shifts sensitively because of mass loading from molecular adsorption. The minimum detectable adsorbed mass on a cantilever sensor can be increased by orders of magnitude by changing the dimensions of the device; smaller and thicker cantilevers offer higher resonance frequency and therefore better mass detection sensitivity. Here we describe micromachined silicon cantilevers that are 0.5 to 4 mum in length, fabricated with the use of a focused ion beam (FIB). In addition, we demonstrate a technique for detection of the cantilever resonance frequency that is based on electron transfer.
引用
收藏
页码:369 / 373
页数:5
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