Observation of antiferromagnetic domains in epitaxial thin films

被引:295
作者
Scholl, A
Stöhr, J
Lüning, J
Seo, JW
Fompeyrine, J
Siegwart, H
Locquet, JP
Nolting, F
Anders, S
Fullerton, EE
Scheinfein, MR
Padmore, HA
机构
[1] Univ Calif Berkeley, Adv Light Source, Berkeley, CA 94720 USA
[2] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA
[3] IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
[4] Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland
[5] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
关键词
D O I
10.1126/science.287.5455.1014
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Antiferromagnetic domains in an epitaxial thin film, LaFeO3 on SrTiO3(100), were observed using a high-spatial-resolution photoelectron emission microscope with contrast generated by the large x-ray magnetic Linear dichroism effect at the multiplet-split L edge of Fe. The antiferromagnetic domains are linked to 90 degrees twinned crystallographic regions in the film. The Neel temperature of the thin film is reduced by 70 kelvin relative to the bulk material, and this reduction is attributed to epitaxial strain. These studies open the door for a microscopic understanding of the magnetic coupling across antiferromagnetic-ferromagnetic interfaces.
引用
收藏
页码:1014 / 1016
页数:3
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