Optical studies of X-ray irradiated (Ga0.4In0.6)2Se3 films

被引：3
作者：
Studenyak, I. P. [1 ]
Pop, M. M. [1 ]
Kranjoec, M. [2 ]
Solomon, A. M. [3 ]
机构：
[1] Uzhgorod Natl Univ, Uzhgorod, Ukraine
[2] Univ North, Varazhdin, Croatia
[3] Inst Electron Phys, Uzhgorod, Ukraine
来源：
UKRAINIAN JOURNAL OF PHYSICAL OPTICS | 2020年 / 21卷 / 04期
关键词：
thin films; spectral ellipsometry; optical transmission spectra; X-ray irradiation; refractive index; pseudogap; ABSORPTION EDGE; THIN-FILMS; CONSTANTS; DISORDER;
D O I：
10.3116/16091833/21/4/184/2020
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
As-deposited (Ga0.4In0.6)(2)Se-3 films are irradiated using a wide-band radiation of Cu-anode X-ray tube during different exposure times. The spectral dependences of refractive index and extinction coefficient are measured with a spectral ellipsometric technique. The optical transmission spectra of X-ray irradiated (Ga0.4In0.6)(2)Se-3 films are studied depending on the irradiation time. The parameters of Urbach absorption edge for those films are determined. The spectral dependences of refractive indices for both non-irradiated and irradiated (Ga0.4In0.6)(2)Se-3 films are described in the framework of Wemple-DiDomenico model.
引用
收藏
页码：184 / 190
页数：7
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