A perfectly stoichiometric and flat CeO2(111) surface on a bulk-like ceria film

被引：72

作者：

Barth, C. ^{[1
]}

Laffon, C. ^{[1
]}

Olbrich, R. ^{[2
]}

Ranguis, A. ^{[1
]}

Parent, Ph. ^{[1
]}

Reichling, M. ^{[2
]}

机构：

[1] Aix Marseille Univ, CNRS, CINaM UMR 7325, F-13288 Marseille, France

[2] Univ Osnabruck, Fachbereich Phys, Barbarastr 7, D-49076 Osnabruck, Germany

来源：

SCIENTIFIC REPORTS | 2016年 / 6卷

关键词：

CEO2 BUFFER LAYERS; DEFECT STRUCTURE; OXIDE; MORPHOLOGY; CHEMISTRY; CRYSTALS; DENSITY; WATER;

D O I：

10.1038/srep21165

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

In surface science and model catalysis, cerium oxide (ceria) is mostly grown as an ultra-thin film on a metal substrate in the ultra-high vacuum to understand fundamental mechanisms involved in diverse surface chemistry processes. However, such ultra-thin films do not have the contribution of a bulk ceria underneath, which is currently discussed to have a high impact on in particular surface redox processes. Here, we present a fully oxidized ceria thick film (180 nm) with a perfectly stoichiometric CeO2(111) surface exhibiting exceptionally large, atomically flat terraces. The film is well-suited for ceria model studies as well as a perfect substitute for CeO2 bulk material.

引用

页数：6

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