Force sensing with nanowire cantilevers

被引:29
作者
Braakman, F. R. [1 ]
Poggio, M. [1 ]
机构
[1] Univ Basel, Klingelbergstr 82, CH-4056 Basel, Switzerland
关键词
nanowires; nanomechanics; force microscopy; optomechanics; force sensing; MAGNETIC DISSIPATION; SILICON NANOWIRES; GAAS NANOWIRES; MICROSCOPY; RESOLUTION; OPTOMECHANICS; RESONATORS; FLUCTUATIONS; MECHANICS; SYSTEMS;
D O I
10.1088/1361-6528/ab19cf
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nanometer-scale structures with high aspect ratios such as nanowires and nanotubes combine low mechanical dissipation with high resonance frequencies, making them ideal force transducers and scanning probes in applications requiring the highest sensitivity. Such structures promise record force sensitivities combined with ease of use in scanning probe microscopes. A wide variety of possible material compositions and functionalizations is available, allowing for the sensing of various kinds of forces. In addition, nanowires possess quasi-degenerate mechanical mode doublets, which allow for sensitive vectorial force and mass detection. These developments have driven researchers to use nanowire cantilevers in various force sensing applications, which include imaging of sample surface topography, detection of optomechanical, electrical, and magnetic forces, and magnetic resonance force microscopy. In this review, we discuss the motivation behind using nanowires as force transducers, explain the methods of force sensing with nanowire cantilevers, and give an overview of the experimental progress so far and future prospects of the field.
引用
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页数:18
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