Characteristics of nanoporous InGaN/GaN multiple quantum wells

被引:9
作者
Wang, W. J. [1 ,2 ]
Yang, G. F. [1 ,2 ,4 ]
Chen, P. [1 ,2 ,3 ]
Yu, Z. G. [1 ,2 ]
Liu, B. [1 ,2 ]
Xie, Z. L. [1 ,2 ]
Xiu, X. Q. [1 ,2 ]
Wu, Z. L. [3 ]
Xu, F. [3 ]
Xu, Z. [3 ]
Hua, X. M. [1 ,2 ]
Zhao, H. [1 ,2 ]
Han, P. [1 ,2 ]
Shi, Y. [1 ,2 ]
Zhang, R. [1 ,2 ]
Zheng, Y. D. [1 ,2 ]
机构
[1] Nanjing Univ, Jiangsu Prov Key Lab Adv Photon & Elect Mat, Nanjing 210093, Jiangsu, Peoples R China
[2] Nanjing Univ, Sch Elect Sci & Engn, Nanjing 210093, Jiangsu, Peoples R China
[3] Nanjing Univ, Inst Optoelect, Yangzhou 225009, Peoples R China
[4] Jiangnan Univ, Sch Sci, Wuxi 214122, Peoples R China
关键词
Nanostructure fabrication; Nanoporous structure; InGaN/GaN multiple quantum wells; Photoluminescence; LIGHT-EMITTING-DIODES; MOLECULAR-BEAM EPITAXY; HIGH-EFFICIENCY; NANOROD ARRAYS; GAN; SAPPHIRE; EMISSION; LAYERS; PHOTOLUMINESCENCE; RELAXATION;
D O I
10.1016/j.spmi.2014.03.012
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The nanoporous InGaN/GaN multiple quantum wells (MQWs) has been fabricated through rapid thermal annealing (RTA) and inductively coupled plasma (ICP) dry etching process using self-assembled Ni nanoporous masks. In comparison with the as-grown planar InGaN/GaN MQWs, both internal quantum efficiency and light extraction efficiency for nanoporous InGaN/GaN MQWs are increased, which can be concluded from the photoluniinescence (PL) measurements. The thermal activation energy of nanoporous structure (107.44 meV) is significantly higher than that of the as-grown sample (33.02 meV) from temperature-dependent PL measurement, indicating that carriers are well confined and the nonradiative recombination caused by the dislocations and other defects has been reduced. Besides, enhanced light scattering in the disordered nanoporous system can further increase the output emission intensity. The enhanced performance of nanoporous InGaN/GaN MQWs reveals its promising applications for high-efficiency light-emitting devices. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:38 / 45
页数:8
相关论文
共 27 条
[1]  
Alt-Ouali A., 1998, J APPL PHYS, V83, P3153
[2]  
[Anonymous], 2000, BLUE LASER DIODE COM
[3]   Light emission and microstructure of Mg-doped AlGaN grown on patterned sapphire [J].
Bell, A ;
Liu, R ;
Ponce, FA ;
Amano, H ;
Akasaki, I ;
Cherns, D .
APPLIED PHYSICS LETTERS, 2003, 82 (03) :349-351
[4]   THERMAL DISSOCIATION OF EXCITONS BOUNDS TO NEUTRAL ACCEPTORS IN HIGH-PURITY GAAS [J].
BIMBERG, D ;
SONDERGELD, M ;
GROBE, E .
PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (10) :3451-+
[5]   Electrical characteristics of InGaN/GaN light-emitting diodes grown on GaN and sapphire substrates [J].
Cao, XA ;
Teetsov, JM ;
D'Evelyn, MP ;
Merfeld, DW ;
Yan, CH .
APPLIED PHYSICS LETTERS, 2004, 85 (01) :7-9
[6]   Strain relaxation and quantum confinement in InGaN/GaN nanoposts [J].
Chen, HS ;
Yeh, DM ;
Lu, YC ;
Chen, CY ;
Huang, CF ;
Tang, TY ;
Yang, CC ;
Wu, CS ;
Chen, CD .
NANOTECHNOLOGY, 2006, 17 (05) :1454-1458
[7]   S-shaped temperature-dependent emission shift and carrier dynamics in InGaN/GaN multiple quantum wells [J].
Cho, YH ;
Gainer, GH ;
Fischer, AJ ;
Song, JJ ;
Keller, S ;
Mishra, UK ;
DenBaars, SP .
APPLIED PHYSICS LETTERS, 1998, 73 (10) :1370-1372
[8]   APPLICATION OF THE MODEL OF THE RELAXATION LINE IN RECIPROCAL SPACE TO II-VI HETEROSTRUCTURES [J].
HEINKE, H ;
EINFELDT, S ;
KUHNHEINRICH, B ;
PLAHL, G ;
MOLLER, MO ;
LANDWEHR, G .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (4A) :A104-A108
[9]   Characterization of threading dislocations in GaN epitaxial layers [J].
Hino, T ;
Tomiya, S ;
Miyajima, T ;
Yanashima, K ;
Hashimoto, S ;
Ikeda, M .
APPLIED PHYSICS LETTERS, 2000, 76 (23) :3421-3423
[10]   Origin of high oscillator strength in green-emitting InGaN/GaN nanocolumns [J].
Kawakami, Y. ;
Suzuki, S. ;
Kaneta, A. ;
Funato, M. ;
Kikuchi, A. ;
Kishino, K. .
APPLIED PHYSICS LETTERS, 2006, 89 (16)