Optical properties of Fe-doped silica films on Si

被引:6
作者
Babonas, G. J.
Reza, A.
Simkiene, I.
Sabataityte, J.
Baran, M.
Szymczak, R.
Karlsson, U. O.
Suchodolskis, A.
机构
[1] Inst Semicond Phys, LT-01108 Vilnius, Lithuania
[2] Vilnius Pedag Univ, LT-08106 Vilnius, Lithuania
[3] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
[4] KTH, Dept Mat Phys, S-16440 Kista, Sweden
关键词
optical properties of composite materials; structure of nanoscale materials; AFM of surfaces;
D O I
10.1016/j.apsusc.2005.12.047
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Optical properties of Fe-doped silica films on Si were investigated by ellipsometric technique in the region 1-5 eV. Samples were produced by sol-gel method. Precursors were prepared by mixing tetraethoxysilane (TEOS) solution in ethanol and water with aqueous solution of Fe-chloride or Fe-acetate. The coating solution was deposited on Si substrates by spin on technique. The size of Fe-containing nanometric-sized particles depended on technology and varied from 20 to 100 nm. Optical response of complex hybrid samples SiO2:Fe/Si was interpreted in a multi-layer model. In the inverse problem, the Maxwell equations were solved by transfer matrix technique. Dielectric function of Fe-doped silica layers was calculated in the model of effective media. Analysis of optical data has shown that various Fe-oxides formed. Experimental data for films obtained from precursors with Fe-acetate and annealed in hydrogen were well described by the model calculations taking into account a small contribution 1-5% of metal Fe imbedded in silica. The Fe/Fe-O contribution to optical response increased for samples grown from FeCl3-precursor. Ellipsometric data for Fe-doped silica films on Si were interpreted taking into account the structural AFM studies as well as the results of magnetic measurements. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:5391 / 5394
页数:4
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