The effects of bandgap grading in a Cu(In, Ga)Se-2 thin film with the average bandgap of 1.4 eV on the performance of the solar cells were investigated by changing a minimum bandgap and its position employing wxAMPS. Considering minority carrier recombination at the CdS/CIGS interface, degradations of solar cell characteristics were observed. In this case, double graded band profile is required in order to suppress the recombination. However, considering also an ordered vacancy compound (OVC) at the interface, a high efficiency that is close to the case without interface recombination was obtained. These results indicate that the field effect passivation owing to OVC can suppress the interface recombination.
机构:
Nankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China
Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USANankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China
Liu, Yiming
Sun, Yun
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Nankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R ChinaNankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China
Sun, Yun
Rockett, Angus
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机构:
Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USANankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China
机构:
Nankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China
Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USANankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China
Liu, Yiming
Sun, Yun
论文数: 0引用数: 0
h-index: 0
机构:
Nankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R ChinaNankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China
Sun, Yun
Rockett, Angus
论文数: 0引用数: 0
h-index: 0
机构:
Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USANankai Univ, Inst Photoelect Thin Film Devices & Technol, Tianjin 300071, Peoples R China