Photodetachment of multiply charged anions

被引：0
|
作者：
Wang, LS [1 ]
机构：
[1] Washington State Univ, Dept Phys, Richland, WA 99352 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2004年 / 227卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
214-PHYS
引用
收藏
页码：U277 / U277
页数：1
相关论文
共 50 条
  • [1] Photodetachment of multiply-charged anions
    Wang, LS
    COMMENTS ON MODERN PHYSICS, 2001, 2 (05): : D207 - D221
  • [2] Multiply charged titanium cluster anions: production and photodetachment
    A. Herlert
    K. Hansen
    L. Schweikhard
    M. Vogel
    Hyperfine Interactions, 2000, 127 : 529 - 532
  • [3] Multiply charged titanium cluster anions: production and photodetachment
    Herlert, A
    Hansen, K
    Schweikhard, L
    Vogel, M
    HYPERFINE INTERACTIONS, 2000, 127 (1-4): : 529 - 532
  • [4] Photodetachment photoelectron spectroscopy of multiply charged anions.
    Wang, LS
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 221 : U242 - U242
  • [5] Photodetachment of multiply-charged anions in the gas phase.
    Wang, LS
    Wang, XB
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U178 - U178
  • [6] Probing free multiply charged anions using photodetachment photoelectron spectroscopy
    Wang, LS
    Wang, XB
    JOURNAL OF PHYSICAL CHEMISTRY A, 2000, 104 (10): : 1978 - 1990
  • [7] Photodetachment photoelectron spectroscopy of multiply charged anions using electrospray ionization
    Wang, LS
    Ding, CF
    Wang, XB
    Barlow, SE
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (04): : 1957 - 1966
  • [8] Electron tunneling through the repulsive Coulomb barrier in photodetachment of multiply charged anions
    Wang, XB
    Ding, CF
    Wang, LS
    CHEMICAL PHYSICS LETTERS, 1999, 307 (5-6) : 391 - 396
  • [9] Photoelectron Spectroscopy of Multiply Charged Anions
    Wang, Xue-Bin
    Wang, Lai-Sheng
    ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 2009, 60 : 105 - 126
  • [10] Multiply charged anions in the gas phase
    Dreuw, A
    Cederbaum, LS
    CHEMICAL REVIEWS, 2002, 102 (01) : 181 - 200
12345