Thermal characterization of chip packages - Evolutionary development of compact models

被引:18
作者
BarCohen, A
Krueger, WB
机构
来源
THIRTEENTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, PROCEEDINGS 1997 | 1997年
关键词
D O I
10.1109/STHERM.1997.566796
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The expanded-R(jc) methodology, first proposed in 1989, makes it possible to extend the use of this common figure-of-merit to chip packages with non-isothermal cases. This proposal spurred considerable debate and contributed to renewed efforts to provide ''compact'' thermal models of single chip packages, for preliminary design, as well as for detailed numerical simulation of populated printed circuit boards. This presentation offers a review of the development of this modified-R(jc) methodology and its efficacy in replicating the chip, or junction, temperature predicted by detailed numerical simulation.
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页码:180 / 197
页数:18
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