Study of the morphology of ultra-thin Pt films as the anode of an organic light emitting display

被引：1

作者：

Lee, Chih-Hao ^{[1
,2
]}

Tzeng, Yao-Dong ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Engn & Syst Sci, Hsinchu 30013, Taiwan

[2] Natl Tsing Hua Univ, Inst Nucl Engn & Sci, Hsinchu 30013, Taiwan

来源：

THIN SOLID FILMS | 2009年 / 517卷 / 17期

关键词：

OLED; Pt thin film; Sheet resistance; X-ray reflectivity; INDIUM-TIN OXIDE; X-RAY REFLECTIVITY; DIODES; PERFORMANCE; INTERFACES; INJECTION; DEVICES; METAL;

D O I：

10.1016/j.tsf.2009.03.128

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An ultra-thin Pt layer could be used as a transparent conducting anode to replace the ITO used today in a top-emitting OLED. A proper thickness of Pt thin layer is needed to avoid large leakage current while still keeping the high transparency for visible light. X-ray reflectivity and AFM were used to measure the morphology of e-gun deposition Pt thin films grown on glass substrates. The islands grown on the glass coalesced at the thickness of less than 4 nm. For the sample of 4 nm thickness, the sheet resistance is 800 Omega/square with a transparency of 65%. (c) 2009 Elsevier B.V. All rights reserved.

引用

页码：5116 / 5119

页数：4

共 21 条

[1] Polymer/metal interfaces and the performance of polymer light-emitting diodes [J].