Space-charge limited current in CdTe thin film solar cell

被引：13

作者：

Li, Qiang ^{[1
]}

Shen, Kai ^{[1
]}

Li, Xun ^{[1
]}

Yang, Ruilong ^{[1
]}

Deng, Yi ^{[2
]}

Wang, Deliang ^{[1
,3
]}

机构：

[1] Univ Sci & Technol China, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Anhui, Peoples R China

[2] Hankou Univ, Coll Elect & Informat Engn, Wuhan 430212, Hubei, Peoples R China

[3] Univ Sci & Technol China, Chinese Acad Sci, Key Lab Mat Energy Convers, Hefei 230026, Anhui, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2018年 / 112卷 / 17期

基金：

中国国家自然科学基金;

关键词：

RECOMBINATION; INSULATORS;

D O I：

10.1063/1.5023106

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this study, we demonstrate that space-charge limited current (SCLC) is an intrinsic current shunting leakage in CdTe thin film solar cells. The SCLC leakage channel, which is formed by contact between the front electrode, CdTe, and the back electrode, acts as a metal-semiconductor-metal (MSM) like transport path. The presence of SCLC leaking microchannels in CdTe leads to a band bending at the MSM structure, which enhances minority carrier recombination and thus decreases the minority carrier lifetime in CdTe thin film solar cells. SCLC was found to be a limiting factor both for the fill factor and the open-circuit voltage of CdTe thin film solar cells. Published by AIP Publishing.

引用

页数：4

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