Characterization of ESD Shielding Bag with Capacitive Probe and IEC 61000-4-2 Generator

被引：0

作者：

Viheriakoski, Toni ^{[1
]}

Fung, Rita ^{[2
]}

Wong, Richard ^{[3
]}

Gartner, Reinhold ^{[4
]}

zur Nieden, Friedrich ^{[4
]}

Tamminen, Pasi ^{[5
]}

机构：

[1] Cascade Metrol, Hakulintie 32, Lohja 08500, Finland

[2] Cisco Syst Hong Kong Ltd, 31 FI Great Eagle Ctr,23 Harbour Rd, Hong Kong, Peoples R China

[3] Cisco Syst Inc, 170 W Tasman Dr, San Jose, CA 95134 USA

[4] Infineon Technol AG, POB 800949, D-81609 Munich, Germany

[5] EDR & Medeso Oy, Finlaysoninkuj 21, Tampere, Finland

来源：

2019 41ST ANNUAL EOS/ESD SYMPOSIUM (EOS/ESD) | 2019年

关键词：

D O I：

10.23919/eos/esd.2019.8869964

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

ESD sensitive devices inside protective packaging may be exposed to high stress levels outside ESD protected area. ESD shielding bags are therefore tested with realistic stress levels by a system level ESD generator. The aim of this study is to estimate statistical uncertainty of ESD shielding measurements with different ESD generators and a capacitive probe.

引用

页数：10

共 11 条

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[3] [Anonymous], 2014, 6134048 IEC
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[5] [Anonymous], SAFETY ASPECTS GUIDE
[6] [Anonymous], D493518 ASTM
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Viheriakoski, T.
Wong, R.
Fung, R.
Tamminen, P.
[J]. ELECTROSTATICS 2019 AND DIELECTRICS 2019, 2019, 1322
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[10] Viheriakoski T., EOS ESD S 2015

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