Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials

被引:0
作者
Sun, Tengqian [1 ,2 ]
Ye, Qing [1 ,2 ]
Wang, Xiaowan [1 ,2 ]
Wang, Jin [1 ,2 ]
Deng, Zhichao [1 ,2 ]
Liu, Shike [1 ,2 ]
Yang, Qilin [1 ,2 ]
Mei, Jianchun [3 ]
Zhou, Wenyuan [1 ,2 ]
Zhang, Chunping [1 ,2 ]
Tian, Jianguo [1 ,2 ]
机构
[1] Nankai Univ, Key Lab Weak Light Nonlinear Photon, Sch Phys, Tianjin 300071, Peoples R China
[2] Nankai Univ, TEDA Appl Phys Sch, Minist Educ, Tianjin 300071, Peoples R China
[3] Nankai Univ, Adv Technol Inst, Tianjin 300071, Peoples R China
关键词
Optical variables measurement; optical microscopy; nonlinear optics; photothermal effects; MICROSCOPY; FIBERS;
D O I
10.1109/LPT.2015.2494591
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light-and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light-and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials.
引用
收藏
页码:260 / 263
页数:4
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