Noncontact measurement of the thermal diffusivity of IR semi-transparent and semiconducting n-CdMgSe mixed crystals by means of the photothermal radiometry

被引：17
作者：
Pawlak, M. [1 ]
Malinski, M. [2 ]
机构：
[1] Nicholas Copernicus Univ, Inst Phys, Fac Phys Astron & Informat, PL-87100 Torun, Poland
[2] Koszalin Univ Technol, Dept Elect & Comp Sci, PL-75453 Koszalin, Poland
来源：
INFRARED PHYSICS & TECHNOLOGY | 2014年 / 64卷
关键词：
Photothermal infrared radiometry; II-VI semiconductors; Thermal waves;
D O I：
10.1016/j.infrared.2014.02.003
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In this paper we present results of noncontact measurements of the thermal diffusivity of infrared semi-transparent n-CdMgSe mixed semiconductor crystals by means of the photothermal radiometry (PTR) in a transmission configuration. In order to overcome an influence of the infrared semi-transparency and plasma waves on the PTR signal from n-CdMgSe mixed crystals the samples were covered by thin aluminum foils on both sides. The thermal diffusivities of n-CdMgSe mixed crystals were estimated from PTR phase frequency characteristics using a well-known formula. It was found that the obtained results are underestimated in comparison to thermal diffusivities estimated from the PPE (photopyro-electric) measurements. A three layer model of a PTR signal was applied in order to estimate an error in determination of the thermal diffusivity of a sample caused by aluminum foils. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码：87 / 90
页数：4
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