X-Ray photoelectron diffraction and photoelectron holography as methods for investigating the local atomic structure of the surface of solids

被引:10
|
作者
Kuznetsov, M. V. [1 ]
Ogorodnikov, I. I. [1 ]
Vorokh, A. S. [1 ]
机构
[1] Russian Acad Sci, Ural Branch, Inst Solid State Chem, Ekaterinburg 620990, Russia
关键词
MULTIPLE-SCATTERING; ANGULAR-DISTRIBUTION; AUGER-ELECTRON; RELIABILITY FACTORS; CIRCULAR-DICHROISM; PHOTOEMISSION; ENERGY; WAVE; FILMS; SPECTROSCOPY;
D O I
10.1070/RC2014v083n01ABEH004400
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The state-of-the-art theory and experimental applications of X-ray photoelectron diffraction (XPD) and photoelectron holography (PH) are discussed. These methods are rapidly progressing and serve to examine the surface atomic structure of solids, including nanostructures formed on surfaces during adsorption of gases, epitaxial film growth, etc. The depth of analysis by these methods is several nanometres, which makes it possible to characterize the positions of atoms localized both on and beneath the surface. A remarkable feature of the XPD and PH methods is their sensitivity to the type of examined atoms and, in the case of high energy resolution, to the particular chemical form of the element under study. The data on experimental applications of XPD and PH to studies of various surface structures are analyzed and generalized.
引用
收藏
页码:13 / 37
页数:25
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