Using a projected fringe pattern to identify the focused image and its application to 3D shape measurements

被引:0
作者
Cheng, Nai-Jen [2 ]
Su, Wei-Hung [1 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Mat Sci & Optoelect Engn, Kaohsiung 804, Taiwan
[2] Natl Kaohsiung Univ Appl Sci, Inst Photon & Commun, Kaohsiung 80778, Taiwan
来源
PHOTONIC FIBER AND CRYSTAL DEVICES: ADVANCES IN MATERIALS AND INNOVATIONS IN DEVICE APPLICATIONS VII | 2013年 / 8847卷
关键词
fringe projection; projected fringe profilometry; one-dimensional scanning; 3D shape measurement; FOURIER-TRANSFORM PROFILOMETRY; PHASE-MEASURING PROFILOMETRY; OBJECTS; DISCONTINUITIES; MULTIFREQUENCY;
D O I
10.1117/12.2025421
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this paper, we present a scanning approach to retrieve the 3D shape of the object with large depth discontinuities. A fringe pattern is projected onto the inspected object. A CCD camera is used to observe the projected fringes. The depth-of-field of the camera lens is so short that only fringes within the focused area can be clearly observed. By moving the inspected object around the focused area along the depth direction, a set of images, which addresses the contour of the object with its corresponding depth, is obtained. The 3D shape of the object is then retrieved by assembling the image contours with their corresponding depths.
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页数:6
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