Phase retrieval with two-beam off-axis x-ray holography

被引：8

作者：

Kohmura, Y

Sakurai, T

Ishikawa, T

Suzuki, Y

机构：

[1] RIKEN, Harima Inst, Mikazuki, Hyogo 6795148, Japan

[2] Japan Synchrotron Radiat Res Inst JASRI, Spring8, Mikazuki, Hyogo 6795198, Japan

来源：

JOURNAL OF APPLIED PHYSICS | 2004年 / 96卷 / 04期

关键词：

D O I：

10.1063/1.1769098

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A wave front dividing x-ray interferometer with a prism was applied to two-beam off-axis holography. Complex amplitudes at the detector plane, which were derived from the hologram using the fringe scanning method, were inversely transformed to those at the exit surface of the specimen. The x-ray phase shift due to the amorphous carbon particles was quantitatively determined with the background of the phase image being as small as approximately lambda/100 at 12.4 keV. (C) 2004 American Institute of Physics.

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页码：1781 / 1784

页数：4

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