Visualization of Latent Fingerprint Corrosion of Brass

被引:11
作者
Bond, John W. [1 ,2 ]
机构
[1] Northamptonshire Police, Sci Support Unit, Northampton NN4 0JQ, England
[2] Univ Leicester, Forens Res Ctr, Leicester LE1 7EA, Leics, England
关键词
forensic science; latent fingerprint; print visualization; metal surface; electrochemical mechanism; latent fingerprint components; WORK FUNCTION;
D O I
10.1111/j.1556-4029.2009.01108.x
中图分类号
DF [法律]; D9 [法律]; R [医药、卫生];
学科分类号
0301 ; 10 ;
摘要
Visualization of latent fingerprint deposits on metals by enhancing the fingerprint-induced corrosion is now an established technique. However, the corrosion mechanism itself is less well understood. Here, we describe the apparatus constructed to measure the spatial variation (Delta V) in applied potential (V) over the surface of brass disks corroded by latent fingerprint deposits. Measurement of Delta V for potential of 1400 V has enabled visualization of fingerprint ridges and characteristics in terms of this potential difference with Delta V typically of a few volts. This visualization is consistent with the formation of a Schottky barrier at the brass-corrosion product junction. Measurement of the work function of the corroded brass of up to 4.87 +/- 0.03 eV supports previous results that suggested that the corrosion product is composed of p-type copper oxides. A model for the galvanic corrosion of brass by ionic salts present in fingerprint deposits is proposed that is consistent with these experimental results.
引用
收藏
页码:1034 / 1041
页数:8
相关论文
共 30 条
[1]  
[Anonymous], 2002, SEMICONDUCTOR DEVICE
[2]  
Ashbaugh D.R., 1999, CRC SER PR CRIM
[3]   PHOTOELECTRIC THRESHOLD, WORK FUNCTION, AND SURFACE BARRIER POTENTIAL OF SINGLE-CRYSTAL CUPROUS-OXIDE [J].
ASSIMOS, JA ;
TRIVICH, D .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 26 (02) :477-488
[4]  
Avissar YY, 2004, J FORENSIC SCI, V49, P1215
[5]  
BARLEV A, 1993, SEMICONDUCTORS ELECT, P96
[6]  
Bartick E, 2002, 16TH MEETING OF THE INTERNATIONAL ASSOCIATION OF FORENSIC SCIENCES, P61
[7]  
BERGER L, 1997, SEMICONDUCTOR MAT, P295
[8]  
Bockris J.OM., 1998, Modern Electrochemistry 1: Ionics, V2nd, P361, DOI [10.1007/b114546, DOI 10.1007/B114546]
[9]   On the electrical characteristics of latent finger mark corrosion of brass [J].
Bond, J. W. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (12)
[10]   The Thermodynamics of Latent Fingerprint Corrosion of Metal Elements and Alloys [J].
Bond, John W. .
JOURNAL OF FORENSIC SCIENCES, 2008, 53 (06) :1344-1352