Simultaneous voltage scaling and gate sizing for low-power design

被引:24
作者
Chen, CH [1 ]
Sarrafzadeh, M
机构
[1] Univ Windsor, Dept Elect & Comp Engn, Windsor, ON N9B 3P4, Canada
[2] Univ Calif Los Angeles, Dept Comp Sci, Los Angeles, CA 90095 USA
关键词
gate sizing; low power; simultaneous approach; voltage scaling;
D O I
10.1109/TCSII.2002.802964
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a new approach using simultineous voltage-scaling and gate-sizing for low power without violating the timing constraints. We provide the problem formulation in this application, and propose algorithms for single voltage-scaling, single gate-sizing, and their simultaneous manipulation. We target a globally optimal solution by showing how the power optimization,is related to the maximum-weighted-independent-set (MWIS) problem. Experimental results on a set of benchmark circuits show that the simultaneous voltage-scaling and gate-sizing generates maximum power reduction. The average power savings range from 23% to 57% over all tested circuits, depending upon the circuit topology, underlying gate library and specific supply voltages.
引用
收藏
页码:400 / 408
页数:9
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