Record-long (21.7 mm) vertically aligned MWNT arrays were synthesized using water-assisted thermal CVD process. The catalyst lifetime was maintained for 790 min at optimized experimental condition. The growth of the centimeter long CNT was observed by real time photography at different growth conditions. The growth length increased linearly with increasing growth time followed by a sudden growth end. The ratio of ethylene and H-2 concentration as well as the water and ethylene concentration was studied and optimized which led to prolong catalyst lifetime. Transmission electron microscope images confirmed that most CNTs were double wall and the number of wall distribution was uniform along different height position. Raman spectra showed that the I-D/I-G ratio remained constant at the 3 studied positions along the CNT. TGA demonstrated negligible impurity incorporation in the CNT array. (C) 2014 Elsevier Ltd. All rights reserved.
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USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Universal Technol Corp, Dayton, OH 45432 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Amama, Placidus B.
;
Pint, Cary L.
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Rice Univ, Dept Phys & Astron, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Pint, Cary L.
;
McJilton, Laura
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Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
McJilton, Laura
;
Kim, Seung Min
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Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Kim, Seung Min
;
Stach, Eric A.
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Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Stach, Eric A.
;
Murray, P. Terry
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Univ Dayton, UDRI, Dayton, OH 45469 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Murray, P. Terry
;
Hauge, Robert H.
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Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Hauge, Robert H.
;
Maruyama, Benji
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USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
机构:
USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Universal Technol Corp, Dayton, OH 45432 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Amama, Placidus B.
;
Pint, Cary L.
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机构:
Rice Univ, Dept Phys & Astron, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Pint, Cary L.
;
McJilton, Laura
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Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
McJilton, Laura
;
Kim, Seung Min
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机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Kim, Seung Min
;
Stach, Eric A.
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机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Stach, Eric A.
;
Murray, P. Terry
论文数: 0引用数: 0
h-index: 0
机构:
Univ Dayton, UDRI, Dayton, OH 45469 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Murray, P. Terry
;
Hauge, Robert H.
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Hauge, Robert H.
;
Maruyama, Benji
论文数: 0引用数: 0
h-index: 0
机构:
USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA