Interfacial intermetallic growth and shear strength of lead-free composite solder joints

被引:131
作者
Nai, S. M. L. [1 ]
Wei, J. [2 ]
Gupta, M. [1 ]
机构
[1] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore
[2] Singapore Inst Mfg Technol, Singapore 638075, Singapore
关键词
Intermetallics; Metal matrix composites; Mechanical properties; Scanning electron microscopy; SN-AG SOLDER; MECHANICAL-PROPERTIES; FRACTURE-BEHAVIOR; CREEP-PROPERTIES; EUTECTIC SNPB; CU; SN-3.5AG; COMPOUND; MICROSTRUCTURE; METALLIZATION;
D O I
10.1016/j.jallcom.2008.05.070
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In the present study, varying weight percentages of carbon nanotubes (CNTs) were incorporated into Sn-Ag-Cu solder matrix, to form composite solders. Isothermal aging study was performed on solder joints, to investigate the formation and growth of the intermetallic compound (IMC) layer at the solder/metallization interface. Shear tests were also conducted on as-soldered and aged solder joints. Results revealed that after soldering, the initial interfacial IMC thickness of the unreinforced solder joint was comparable to that of the composite solder joints. However, after aging, the interfacial IMC layer of the unreinforced solder joint was observed to grow more significantly than that of the composite solder joints. Moreover, the composite solder joints also exhibited lower diffusion coefficient and this signified that the presence of CNTs was effective in retarding the growth of the IMC layer. Shear tests results revealed that as-soldered and aged composite solder joints had better shear strength than their monolithic counterparts and the shear strength of all aged solder joints decreased with increasing aging time. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:100 / 106
页数:7
相关论文
共 40 条
[1]   Microstructure and shear strength evolution of SnAg/Cu surface mount solder joint during aging [J].
Ahat, S ;
Sheng, M ;
Luo, L .
JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (10) :1317-1322
[2]   Interdiffusion analysis of the soldering reactions in Sn-3.5Ag/Cu couples [J].
Bae, YS ;
Kim, SJ .
JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (11) :1452-1457
[3]   Interfacial reactions in the Sn-(Cu)/Ni, Sn-(Ni)/Cu, and Sn/(Cu,Ni) systems [J].
Chen, SW ;
Wu, SH ;
Lee, SW .
JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (11) :1188-1194
[4]   Creep properties of Sn-Ag solder joints containing intermetallic particles [J].
Choi, S ;
Lee, JG ;
Guo, F ;
Bieler, TR ;
Subramanian, KN ;
Lucas, JP .
JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2001, 53 (06) :22-26
[5]   Formation and growth of interfacial intermetallic layers in eutectic Sn-Ag solder and its composite solder joints [J].
Choi, S ;
Lucas, JP ;
Subramanian, KN ;
Bieler, TR .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2000, 11 (06) :497-502
[6]  
Clyne T.W., 1993, INTRO METAL MATRIX C
[7]   Size-dependent inelastic behavior of particle-reinforced metal-matrix composites [J].
Dai, LH ;
Ling, Z ;
Bai, YL .
COMPOSITES SCIENCE AND TECHNOLOGY, 2001, 61 (08) :1057-1063
[8]   Influence of reflow and thermal aging on the shear strength and fracture behavior of Sn-3.5Ag Solder/Cu joints [J].
Deng, X ;
Sidhu, RS ;
Johnson, P ;
Chawla, N .
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2005, 36A (01) :55-64
[9]   Processing and aging characteristics of eutectic Sn-3.5Ag solder reinforced with mechanically incorporated Ni particles [J].
Guo, F ;
Lee, J ;
Choi, S ;
Lucas, JP ;
Bieler, TR ;
Subramanian, KN .
JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (09) :1073-1082
[10]   Microstructural characterisation of reflowed and isothermally-aged Cu and Ag particulate reinforced Sn-3.5Ag composite solders [J].
Guo, F ;
Choi, S ;
Lucas, JP ;
Subramanian, KN .
SOLDERING & SURFACE MOUNT TECHNOLOGY, 2001, 13 (01) :7-18