The macroscopic model of an atomic force microscope in the students' laboratory

被引：13

作者：

Greczylo, Tomasz ^{[1
]}

Debowska, Ewa ^{[1
]}

机构：

[1] Univ Wroclaw, Inst Expt Phys, PL-50204 Wroclaw, Poland

来源：

EUROPEAN JOURNAL OF PHYSICS | 2006年 / 27卷 / 03期

关键词：

Atomic force microscopy;

D O I：

10.1088/0143-0807/27/3/004

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

This paper presents a macroscopic model of an atomic force microscope. The tool is designed for an advanced physics experiment to be carried out in Physics Laboratory II at the Institute of Experimental Physics, Wroclaw University. We discuss the process of setting up the experiment and the results of measurements of the model's characteristics. The image of a model surface topography realized with the apparatus is also presented. The advantages and disadvantages of the apparatus are discussed along with descriptions of its possible future uses.

引用

页码：501 / 513

页数：13

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