Internal oxidation of Ag-xIn alloys at low homologous temperature

被引:12
作者
Ghaffari, Y. [1 ]
Daub, K. [1 ]
Newman, R. C. [2 ]
Persaud, S. Y. [1 ]
机构
[1] Queens Univ, Dept Mech & Mat Engn, 99 Univ Ave, Kingston, ON K7L 3N6, Canada
[2] Univ Toronto, Dept Chem Engn & Appl Chem, 200 Coll St, Toronto, ON M5S 3E5, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
Internal oxidation; EBSD; TEM; Crystallographic orientation; Grain boundary misorientation; PREFERENTIAL INTERGRANULAR OXIDATION; STRESS-CORROSION CRACKING; TRANSMISSION ELECTRON-MICROSCOPY; ATOM-PROBE TOMOGRAPHY; NI-CR ALLOYS; SELECTIVE OXIDATION; BOUNDARY MIGRATION; EXTERNAL OXIDATION; HYDROGENATED STEAM; CO2; GAS;
D O I
10.1016/j.corsci.2020.108869
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Internal oxidation of Ag-xIn alloys (x = 10, 13, 16 at%) was studied in an air atmosphere at a relatively low homologous temperature (240 degrees C), where lattice diffusion is negligible. After exposure, metallic Ag nodules were present on the surfaces of all alloys, expelled to relieve stress due to internal oxidation, confirming that such coarse morphologies can be produced by short-circuit transport. Crystallographic orientation and grain boundary misorientation were found to influence nodule expulsion tendency, and the propensity for internal or external oxidation. Further analytical TEM characterization was used to study the nanoscale morphology and chemistry of nodules and internal oxide(s).
引用
收藏
页数:13
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