Crystallisation kinetics in Se80-xTe20Sbx glassy alloys

被引：0
|
作者：
Singh, A
Nagpal, AK
Kumar, A [1 ]
机构：
[1] Harcourt Butler Technol Inst, Dept Phys, Kanpur 208002, Uttar Pradesh, India
[2] Harcourt Butler Technol Inst, Dept Plast Technol, Kanpur 208002, Uttar Pradesh, India
来源：
ADVANCED MATERIALS FOR OPTICS AND ELECTRONICS | 1999年 / 9卷 / 03期
关键词：
glasses; crystallisation; kinetics;
D O I：
10.1002/(SICI)1099-0712(199905/06)9:3<95::AID-AMO368>3.0.CO;2-H
中图分类号：
O69 [应用化学];
学科分类号：
081704 ;
摘要：
The kinetics of crystallisation has been studied in glassy Se80-xTe20Sbx (0 less than or equal to x less than or equal to 15) by two different techniques: (i) a non-isothermal DSC technique where multiscans at different heating rates are used to calculate the kinetic parameters; (ii) isothermal annealing at different temperatures near the crystallisation temperature and measuring the conductivity variation with time, The activation energies obtained by the two techniques match reasonably well, A discontinuity in Delta E is observed at 10 at% Sb which is explained in terms of a mechanically optimised structure at a particular composition. Copyright (C) 1999 John Wiley & Sons, Ltd.
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页码：95 / 106
页数：12
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