Ferroelectric phase transition in Pb0.60Sr0.40TiO3 thin films

被引:5
作者
Leal, SH
Pontes, FM
Leite, ER
Longo, E
Pizani, PS
Chiquito, AJ
Machado, MAC
Varela, JA
机构
[1] UFSCar, LIEC, CMDMC, Dept Chem, BR-13565905 Sao Carlos, Brazil
[2] UFSCar, Dept Phys, BR-13565905 Sao Carlos, Brazil
[3] UNESP, Inst Chem, Araraquara, Brazil
基金
巴西圣保罗研究基金会;
关键词
phase transition; chemical synthesis; thin films; Raman spectroscopy;
D O I
10.1016/j.matchemphys.2004.05.032
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Polycrystalline Pb-0.Sr-60(0).40TiO3 thin films with the tetragonal perovskite structure were grown on platinum-coated silicon substrates by a chemical method. Raman results reveal that A1 (1 TO) symmetry modes, also known as soft modes, persist above the phase transition 14 temperature. This is due to the high structural distortion caused by the substitution effect of Sr2+ for Pb2+ ions. In contrast, the E(1TO) symmetry mode vanishes at 498 K, characterizing the ferroelectric-paraelectric transition phase. However, the Raman spectra, as a function of temperature, reveal that the ferroelectric-paraelectric phase transition may be correlated with a diffuse phase transition. The experimental data obtained from measurements of the dielectric constant as a function of temperature and frequencies showed a classical behavior of ferroelectric phase transition in Pb-0.Sr-60(0).40TiO3 thin films, rather than a relaxor ferroelectric phase transition. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:353 / 356
页数:4
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