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Graphite/CdMnTe Schottky diodes and their electrical characteristics
被引:17
作者:
Kosyachenko, L. A.
[1
]
Yatskiv, R.
[2
]
Yurtsenyuk, N. S.
[1
]
Maslyanchuk, O. L.
[1
]
Grym, J.
[2
]
机构:
[1] Chernivtsi Natl Univ, UA-58012 Chernovtsy, Ukraine
[2] Acad Sci Czech Republic, Inst Photon & Elect, Vvi, CZ-18251 Prague 8, Czech Republic
关键词:
GAMMA-RAY DETECTORS;
HARD X-RAY;
CDMNTE CRYSTALS;
RECOMBINATION;
GENERATION;
GROWTH;
D O I:
10.1088/0268-1242/29/1/015006
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
The first Schottky diodes based on n-CdMnTe crystals with pronounced rectifying properties are investigated. It is shown that the I-V characteristics of the diodes fabricated by printing colloidal graphite can be described by the Sah-Noyce-Shockley theory of generation-recombination in the space charge region. Exponential increase of forward current with voltage is limited by a relatively low barrier height at the graphite/CdMnTe contact (similar to 0.4 eV) and a significant series resistance of the crystal bulk (similar to 10(6) Omega at room temperature). Tunneling due to high concentration of uncompensated impurities in investigated Cd0.9Mn0.1Te crystals (7 x 10(17) cm(-3)) does not allow increasing the reverse bias voltage to the values needed for the operation of x- and gamma-ray detectors. High concentration of uncompensated donors is interpreted by the fact that a certain part of the Mn atoms does not substitute for Cd but plays a role of over-stoichiometric impurities. In the case of the presence of a thin intermediate insulator layer in the graphite/CdMnTe contact, a rapid increase in the current for both polarities of high voltage due to the Frenkel-Poole emission is observed. The obtained results shed light on the problems of technology of growing and post-processing CdMnTe crystals regarded as a prospective material for x- and gamma-ray detectors.
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页数:10
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