Structure and optical properties of sapphire implanted with boron at room temperature and 1000°C

被引:4
作者
McHargue, Carl J.
Alves, E.
Ononye, L. C.
Marques, C.
机构
[1] Univ Tennessee, Ctr Mat Proc, Knoxville, TN 37996 USA
[2] Inst Tecnol & Nucl, Dep Fis, P-2686953 Sacavem, Portugal
[3] Univ Lisbon, Ctr Fis Nucl, P-1699 Lisbon, Portugal
关键词
ion implantation; sapphire; defect structure;
D O I
10.1016/j.nimb.2006.04.086
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Many previous studies of ion-implanted sapphire have used gas-forming light ions or heavier metallic cations. In this study, boron (10(17) cm(-2), 150 keV) was implanted in c-axis crystals at room temperature, 500 and 1000 degrees C as part of a continuing study of cascade density and "chemical" effects on the structure of sapphire. Rutherford backscattering-ion channeling (RBS-C) of the RT samples indicated little residual disorder in the Al-sublattice to a depth of 50-75 nm but almost random scattering at the depth of peak damage energy deposition. The transmission electron micrographs contain "black-spot" damage features. The residual disorder is much less at all depths for samples implanted at 1000 degrees C. The TEM photographs show a coarse "black-spot damage" microstructure. The optical absorption at 205 nm is much greater than for samples implanted with Q N, or Fe under similar conditions. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:81 / 84
页数:4
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