Class specification implementation graphs and their application in regression testing

被引:3
作者
Beydeda, S [1 ]
Gruhn, V [1 ]
机构
[1] Univ Dortmund, Dept Comp Sci, D-44221 Dortmund, Germany
来源
26TH ANNUAL INTERNATIONAL COMPUTER SOFTWARE AND APPLICATIONS CONFERENCE, PROCEEDINGS | 2002年
关键词
D O I
10.1109/CMPSAC.2002.1045111
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Most techniques proposed for regression testing are either black- or white-box techniques, i.e. they solely consider either the specification or implementation of a program. However a combined technique can lead to significant savings in testing costs as some testing tasks need to be carried out once. Furthermore, the same test cases can cover both specification and implementation, reducing the total number of test cases. This paper shows the application of class specification implementation graphs (CSIGs) in regression testing. The distinguishing feature of CSIGs from existing representations is that each method of a class is shown from two perspectives, namely the specification and implementation view. Moreover a test suite reduction strategy has been incorporated to the CSIG construction algorithm to decrease the total number of test cases required. In this paper we show how CSIGs can be combined with an existing test case selection algorithm for regression testing.
引用
收藏
页码:835 / 840
页数:4
相关论文
共 12 条
[1]   A graphical class representation for integrated black- and white-box testing [J].
Beydeda, S ;
Gruhn, V ;
Stachorski, M .
IEEE INTERNATIONAL CONFERENCE ON SOFTWARE MAINTENANCE, PROCEEDINGS: SYSTEMS AND SOFTWARE EVOLUTION IN THE ERA OF THE INTERNET, 2001, :706-715
[2]   Integrating white- and black-box techniques for class-level regression testing [J].
Beydeda, S ;
Gruhn, V .
25TH ANNUAL INTERNATIONAL COMPUTER SOFTWARE & APPLICATIONS CONFERENCE, 2001, :357-362
[3]  
BEYDEDA S, 2000, SEA SOFTW ENG APPL C, P23
[4]   On the completeness of a test suite reduction strategy [J].
Chen, TY ;
Lau, MF .
COMPUTER JOURNAL, 1999, 42 (05) :430-440
[5]  
Harrold M. J., 1993, ACM Transactions on Software Engineering and Methodology, V2, P270, DOI 10.1145/152388.152391
[6]  
Harrold M. J., 1994, SIGSOFT Software Engineering Notes, V19, P154, DOI 10.1145/195274.195402
[7]  
HONG HS, 1995, ASPEC 95, P234
[8]  
Huo Yan Chen, 1998, ACM Transactions on Software Engineering and Methodology, V7, P250, DOI 10.1145/287000.287004
[9]  
OFFUT J, 1995, INT C TEST COMP SOFT, P111
[10]   SELECTING SOFTWARE TEST DATA USING DATA FLOW INFORMATION [J].
RAPPS, S ;
WEYUKER, EJ .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1985, 11 (04) :367-375