Horizontally redundant, split-gate a-Si:H thin film transistors

被引:5
作者
Kuo, Y
机构
[1] IBM T.J. Watson Research Center, Yorktown Heights
关键词
D O I
10.1149/1.1837070
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
A new type of trilayer amorphous silicon (a-Si:H) thin film transistor (TFT) is presented in this paper. It also has a self-aligned source/drain-to-gate configuration and uniformly narrow source/drain vias. The finished transistor shows an on/off current ratio greater than 10(7) and the on-current is proportional to the channel width-to-length ratio, Compared with a conventional single-channel TFT that occupies the same area, this new TFT has a higher channel width-to-length ratio and a higher on-current. The physical limitations of the new TFT, based on the current large area lithography tool, are also discussed. This TFT can be applied. to displays and imagers that require a high on-current and a low area occupancy.
引用
收藏
页码:2680 / 2682
页数:3
相关论文
共 6 条
[1]   REACTIVE ION ETCHING OF PECVD N+ A-SI-H - PLASMA DAMAGE TO PECVD SILICON-NITRIDE FILM AND APPLICATION TO THIN-FILM TRANSISTOR PREPARATION [J].
KUO, Y ;
CROWDER, MS .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (02) :548-552
[2]   A SELF-ALIGNED, TRILAYER, A-SIH THIN-FILM TRANSISTOR PREPARED FROM 2 PHOTOMASKS [J].
KUO, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (04) :1199-1204
[3]   THIN-FILM TRANSISTORS WITH MULTISTEP DEPOSITED AMORPHOUS-SILICON LAYERS [J].
KUO, Y .
APPLIED PHYSICS LETTERS, 1995, 67 (15) :2173-2175
[4]  
KUO Y, 1992, THIN FILM TRANSISTOR, V2
[5]  
OGURA H, 1986, JAPAN DISPLAY 86, P208
[6]  
POWELL MJ, 1988, P SID, V29, P227