New generation of LTCC materials

被引:8
作者
Valant, M [1 ]
Suvorov, D [1 ]
机构
[1] Jozef Stefan Inst, Adv Mat Dept, Ljubljana 1000, Slovenia
来源
BOLETIN DE LA SOCIEDAD ESPANOLA DE CERAMICA Y VIDRIO | 2004年 / 43卷 / 03期
关键词
dielectric properties; substrates; capacitors; LTCC; Bi-based compounds;
D O I
10.3989/cyv.2004.v43.i3.444
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
To reduce the complexity of LTCC systems and so accelerate the development of LTCC tapes with new functionalities it is necessary to reduce the number of phases within a particular tape. This can best be done by using glass-free single-phase ceramic systems. Such a material system consisting of low- and high-permittivity LTCC materials was developed based on Bi eulytite (permittivity; kappa'=16) and sillenite (kappa'=40) compounds and the delta-Bi2O3 solid solution with Nb2O5 (kappa'=90). The Ge and Si analogues of the sillenites and eulytites, and the 0.75Bi(2)O(3).0.25Nb(2)O(5) solid solution meet the main requirements for LTCC with respect to their sintering behavior (T-s=850-900degreesC), their mutual chemical compatibility, their compatibility with a silver electrode as well as their dielectric properties.
引用
收藏
页码:634 / 639
页数:6
相关论文
共 28 条
[1]   The new oxygen-deficient fluorite Bi3NbO7:: Synthesis, electrical behavior and structural approach [J].
Castro, A ;
Aguado, E ;
Rojo, JM ;
Herrero, P ;
Enjalbert, R ;
Galy, J .
MATERIALS RESEARCH BULLETIN, 1998, 33 (01) :31-41
[2]  
Davies PK, 1997, J AM CERAM SOC, V80, P1727, DOI 10.1111/j.1151-2916.1997.tb03046.x
[3]  
FIRSOV AV, 1985, INORG MATER, V31, P378
[4]  
JANEAR B, 2001, J MATER SCI LETT, V20, P71
[5]  
Jantunen H, 2000, J AM CERAM SOC, V83, P2855, DOI 10.1111/j.1151-2916.2000.tb01644.x
[6]   Q-FACTOR MEASUREMENT WITH NETWORK ANALYZER [J].
KAJFEZ, D ;
HWAN, EJ .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1984, 32 (07) :666-670
[7]  
KARGIN YF, 1991, INORG MATER+, V27, P469
[8]  
Kargin Yu. F., 1991, RUSS J INORG CHEM+, V36, P1466
[9]  
Negas T., 1995, CERAM T, V53, P179
[10]  
Petzelt J., 1996, Ferroelectrics, V176, P145, DOI 10.1080/00150199608223607