Optical Vector Network Analyzer Based on Single-Sideband Modulation and Segmental Measurement

被引：31

作者：

Li, Wei ^{[1
]}

Wang, Wen Ting ^{[1
]}

Wang, Li Xian ^{[1
]}

Zhu, Ning Hua ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

来源：

IEEE PHOTONICS JOURNAL | 2014年 / 6卷 / 02期

基金：

中国国家自然科学基金;

关键词：

Optical vector network analyzer; single-sideband modulation; HIGH-RESOLUTION; WIDE-BAND; GENERATION; GRATINGS;

D O I：

10.1109/JPHOT.2014.2311443

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We propose an optical vector network analyzer (OVNA) based on single-sideband (SSB) modulation and segmental measurement. The motivation of this work lies in the fact that it is hard for the previous SSB-based OVNA to measure a device-under-test (DUT) with bandpass response. In our scheme, the transmission response of the DUT is divided into several segments, which are measured one by one using the SSB modulation method. The frequency interval between adjacent segments is precisely controlled by a microwave source. The full transmission response of the DUT is obtained by combining the measured results of different segments. The adjacent segments are connected using the overlapped transmission responses. A proof-of-concept experiment was carried out to measure the transmission response of an optical bandpass filter. It was successfully obtained over a frequency range of 80.05 GHz with a resolution of 25 MHz.

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