Introduction: Advanced Measurement Techniques in Aerospace

被引：0
|
作者：
Naguib, Ahmed
Clemens, Noel
机构：
来源：
AIAA JOURNAL | 2009年 / 47卷 / 04期
关键词：
D O I：
10.2514/1.43606
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：802 / 802
页数：1
相关论文
共 50 条
  • [31] Spinal imaging update AN INTRODUCTION TO TECHNIQUES FOR ADVANCED MRI
    Patel, A.
    James, S. L.
    Davies, A. M.
    Botchu, R.
    BONE & JOINT JOURNAL, 2015, 97B (12) : 1683 - 1692
  • [32] Introduction: Advanced multiphoton and fluorescence lifetime imaging techniques
    Diaspro, Alberto
    MICROSCOPY RESEARCH AND TECHNIQUE, 2007, 70 (05) : 397 - 397
  • [33] Advanced techniques for reconstruction following neurosurgical interventions INTRODUCTION
    Prevedello, Daniel M.
    Mayberg, Marc R.
    London Jr, Nyall
    Mitchell, Kerry-Ann
    Cavallo, Luigi Maria
    Benjamin, Carolina G.
    NEUROSURGICAL FOCUS, 2025, 58 (02) : E1 - E1
  • [34] ADVANCED CERAMICS IN AEROSPACE
    MEETHAM, GW
    CHEMISTRY & INDUSTRY, 1986, (19) : 636 - 640
  • [35] Advanced model-based FDIR techniques for aerospace systems: Today challenges and opportunities
    Zolghadri, Ali
    PROGRESS IN AEROSPACE SCIENCES, 2012, 53 : 18 - 29
  • [36] INTRODUCTION TO WHEATSTONE-BRIDGE MEASUREMENT TECHNIQUES FOR NONELECTRICALS
    ARTHUR, K
    MACHINE DESIGN, 1971, 43 (26) : 82 - &
  • [37] Improved laser measurement using advanced techniques: A review
    Liu, Tiegen
    Fu, Yu
    Wang, Shuang
    Jiang, Junfeng
    Sang, Mei
    Wu, Zhiyang
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2022, 64 (12) : 2256 - 2263
  • [38] Introduction - The aerospace industry in the West
    Launius, RD
    JOURNAL OF THE WEST, 1997, 36 (03) : 6 - 7
  • [39] NATIONAL AEROSPACE PLANE - INTRODUCTION
    WALTRUP, PJ
    JOHNS HOPKINS APL TECHNICAL DIGEST, 1990, 11 (3-4): : 311 - 311
  • [40] Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks
    Smith, Stewart
    Tsiamis, Andreas
    McCallum, Martin
    Hourd, Andrew C.
    Stevenson, J. T. M.
    Walton, Anthony J.
    Dixson, Ronald G.
    Allen, Richard A.
    Potzick, James E.
    Cresswell, Michael W.
    Orji, Ndubuisi G.
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2009, 22 (01) : 72 - 79
12345