Direct observation of decoupled Dirac states at the interface between topological and normal insulators

Several proposed applications and exotic effects in topological insulators rely on the presence of helical Dirac states at the interface between a topological insulator and a normal insulator. In the present work, we have used low-energy angle-resolved photoelectron spectroscopy to uncover and characterize the interface states of Bi2Se3 thin films and Bi2Te3/Bi2Se3 heterostructures grown on Si(111). The results establish that Dirac fermions are indeed present at the topological-normal-insulator boundary and absent at the topological-topological-insulator interface. Moreover, it is demonstrated that band bending present within the topological-insulator films leads to a substantial separation of the interface and surface states in energy. These results pave the way for further studies and the realization of interface-related phenomena in topological-insulator thin-film heterostructures.