A 7-bit 900-MS/s 2-Then-3-bit/cycle SAR ADC With Background Offset Calibration

被引:35
作者
Li, Dengquan [1 ]
Zhu, Zhangming [1 ]
Liu, Jiaxin [2 ]
Zhuang, Haoyu [3 ]
Yang, Yintang [1 ]
Sun, Nan [2 ,4 ]
机构
[1] Xidian Univ, Sch Microelect, Shaanxi Key Lab Integrated Circuits & Syst, Xian 710071, Peoples R China
[2] Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
[3] Univ Elect Sci & Technol China, Sch Elect Sci & Engn, Chengdu 611731, Peoples R China
[4] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA
基金
中国国家自然科学基金;
关键词
2-then-3; bit/cycle; comparator; high speed; multi-bit/cycle successive approximation register analog-to-digital converter (SAR ADC); offset calibration; COMPARATOR; SPEED; CMOS;
D O I
10.1109/JSSC.2020.3011753
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article presents a 7-bit 900-MS/s multi-bit/cycle successive approximation register (SAR) analog-to-digital converter (ADC) with background offset calibration. Unlike prior works that adopt either four capacitive DACs (CDACs) or interpolated resistive DAC to enable 3-bit/cycle operation, the proposed technique uses only two CDACs to realize the same functionality. The number of CDACs is reduced by embedding gain inside the two-path comparators, resulting in reduced power, area, and input loading. In addition, the built-in redundancy relaxes the accuracy requirements for DAC settling and comparators. On-chip background offset calibration with narrow pulse charge sharing is used to further improve the ADC linearity. The prototype fabricated in 40-nm LP CMOS achieves an SNDR of 39.7 dB at Nyquist input and consumes 2.6 mW including on-chip calibration, leading to a Walden FoM of 36.6 fJ/conversion-step.
引用
收藏
页码:3051 / 3063
页数:13
相关论文
共 27 条
[11]   A 24-72-GS/s 8-b Time-Interleaved SAR ADC With 2.0-3.3-pJ/Conversion and >30 dB SNDR at Nyquist in 14-nm CMOS FinFET [J].
Kull, Lukas ;
Luu, Danny ;
Menolfi, Christian ;
Brandli, Matthias ;
Francese, Pier Andrea ;
Morf, Thomas ;
Kossel, Marcel ;
Cevrero, Alessandro ;
Ozkaya, Ilter ;
Toifl, Thomas .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2018, 53 (12) :3508-3516
[12]   Implementation of Low-Power 6-8 b 30-90 GS/s Time-Interleaved ADCs With Optimized Input Bandwidth in 32 nm CMOS [J].
Kull, Lukas ;
Pliva, Jan ;
Toifl, Thomas ;
Schmatz, Martin ;
Francese, Pier Andrea ;
Menolfi, Christian ;
Braendli, Matthias ;
Kossel, Marcel ;
Morf, Thomas ;
Andersen, Toke Meyer ;
Leblebici, Yusuf .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2016, 51 (03) :636-648
[13]   A 3.1 mW 8b 1.2 GS/s Single-Channel Asynchronous SAR ADC With Alternate Comparators for Enhanced Speed in 32 nm Digital SOI CMOS [J].
Kull, Lukas ;
Toifl, Thomas ;
Schmatz, Martin ;
Francese, Pier Andrea ;
Menolfi, Christian ;
Braendli, Matthias ;
Kossel, Marcel ;
Morf, Thomas ;
Andersen, Toke Meyer ;
Leblebici, Yusuf .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2013, 48 (12) :3049-3058
[14]   Analysis and Background Self-Calibration of Comparator Offset in Loop-Unrolled SAR ADCs [J].
Liu, Shaolong ;
Rabuske, Taimur ;
Paramesh, Jeyanandh ;
Pileggi, Lawrence ;
Fernandes, Jorge .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2018, 65 (02) :458-470
[15]   A 12-bit 300-MS/s SAR ADC With Inverter-Based Preamplifier and Common-Mode-Regulation DAC in 14-nm CMOS FinFET [J].
Luu, Danny ;
Kull, Lukas ;
Toifl, Thomas ;
Menolfi, Christian ;
Brandli, Matthias ;
Francese, Pier Andrea ;
Morf, Thomas ;
Kossel, Marcel ;
Yueksel, Hazar ;
Cevrero, Alessandro ;
Ozkaya, Ilter ;
Huang, Qiuting .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2018, 53 (11) :3268-3279
[16]  
Miyahara M, 2008, IEEE ASIAN SOLID STA, P269, DOI 10.1109/ASSCC.2008.4708780
[17]   A 12-Bit 1.6, 3.2, and 6.4 GS/s 4-b/Cycle Time-Interleaved SAR ADC With Dual Reference Shifting and Interpolation [J].
Nam, Jae-Won ;
Hassanpourghadi, Mohsen ;
Zhang, Aoyang ;
Chen, Mike Shuo-Wei .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2018, 53 (06) :1765-1779
[18]   A 6-Bit 50-MS/s Threshold Configuring SAR ADC in 90-nm Digital CMOS [J].
Nuzzo, Pierluigi ;
Nani, Claudio ;
Armiento, Costantino ;
Sangiovanni-Vincentelli, Alberto ;
Craninckx, Jan ;
Van der Plas, Geert .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2012, 59 (01) :80-92
[19]  
Ragab K, 2016, PROC EUR SOLID-STATE, P417, DOI 10.1109/ESSCIRC.2016.7598330
[20]   A 5-GS/s 158.6-mW 9.4-ENOB Passive-Sampling Time-Interleaved Three-Stage Pipelined-SAR ADC With Analog-Digital Corrections in 28-nm CMOS [J].
Ramkaj, Athanasios T. ;
Pena Ramos, Juan C. ;
Pelgrom, Marcel J. M. ;
Steyaert, Michiel S. J. ;
Verhelst, Marian ;
Tavernier, Filip .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2020, 55 (06) :1553-1564