A 7-bit 900-MS/s 2-Then-3-bit/cycle SAR ADC With Background Offset Calibration

被引:34
作者
Li, Dengquan [1 ]
Zhu, Zhangming [1 ]
Liu, Jiaxin [2 ]
Zhuang, Haoyu [3 ]
Yang, Yintang [1 ]
Sun, Nan [2 ,4 ]
机构
[1] Xidian Univ, Sch Microelect, Shaanxi Key Lab Integrated Circuits & Syst, Xian 710071, Peoples R China
[2] Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
[3] Univ Elect Sci & Technol China, Sch Elect Sci & Engn, Chengdu 611731, Peoples R China
[4] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA
基金
中国国家自然科学基金;
关键词
2-then-3; bit/cycle; comparator; high speed; multi-bit/cycle successive approximation register analog-to-digital converter (SAR ADC); offset calibration; COMPARATOR; SPEED; CMOS;
D O I
10.1109/JSSC.2020.3011753
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article presents a 7-bit 900-MS/s multi-bit/cycle successive approximation register (SAR) analog-to-digital converter (ADC) with background offset calibration. Unlike prior works that adopt either four capacitive DACs (CDACs) or interpolated resistive DAC to enable 3-bit/cycle operation, the proposed technique uses only two CDACs to realize the same functionality. The number of CDACs is reduced by embedding gain inside the two-path comparators, resulting in reduced power, area, and input loading. In addition, the built-in redundancy relaxes the accuracy requirements for DAC settling and comparators. On-chip background offset calibration with narrow pulse charge sharing is used to further improve the ADC linearity. The prototype fabricated in 40-nm LP CMOS achieves an SNDR of 39.7 dB at Nyquist input and consumes 2.6 mW including on-chip calibration, leading to a Walden FoM of 36.6 fJ/conversion-step.
引用
收藏
页码:3051 / 3063
页数:13
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