The effect of succinic acid on the physico-chemical characterization studies of benzil NLO single crystal

被引:2
作者
Gilda, Jarald Brigit M. J. [1 ,2 ]
Selvaraj, Anbarasu [1 ]
Devarajan, Prem Anand [1 ]
机构
[1] St Xaviers Coll, Dept Phys, Palayankottai, India
[2] Ponjesly Coll Engn, Dept Phys, Nagercoil, India
来源
OPTIK | 2015年 / 126卷 / 24期
关键词
Pure benzil (PB); Succinic acid doped benzil (SAB); XRD; FTIR; UV-vis; DOPED BENZIL; ORGANIC-CRYSTALS; GROWTH; EMISSION; PURE; MELT; CZOCHRALSKI;
D O I
10.1016/j.ijleo.2015.09.130
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In the present work, an attempt is made to study the influence of succinic acid on the physio-chemical characterization properties of benzil NLO single crystals. Slow evaporation technique has been employed to harvest pure benzil (PB) and succinic acid doped benzil (SAB) crystals. The dimensions of PB and SAB crystals were found to be 21 mm x 4 mm x 4 mm and 13 mm x 4 mm x 3 mm, respectively. The as grown crystals were characterized by XRD, FTIR, UV-vis, TG//DSC, microhardness, H-1 and C-13 and dielectric measurements. The presence of dopants has been confirmed by spectral analysis and by XRD. The lattice parameters of the grown crystals were determined by XRD analysis. The absorbance and mechanical strength of pure and doped crystals were assessed by UV-vis and Vickers microhardness analysis. The various functional groups in the molecule were estimated by FTIR analysis. The presence of hydrogen and carbon bonded network were elucidated using H-1 and C-13 NMR spectral analysis. The thermal stability and the phases of decomposition were measured by TG and DSC analysis. The effect of polarization on the doping of succinic acid into benzil NLO crystal was studied by dielectric measurements. The presence of SHG was identified by Kurtz and Perry test. (C) 2015 Elsevier GmbH. All rights reserved.
引用
收藏
页码:5392 / 5397
页数:6
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