The influence of leaf rust resistance genes Lr29, Lr34, Lr35 and Lr37 on breadmaking quality in wheat

被引:18
作者
Labuschagne, MT
Pretorius, ZA
Grobbelaar, B
机构
[1] Univ Orange Free State, Dept Plant Breeding, ZA-9300 Bloemfontein, South Africa
[2] Univ Orange Free State, Dept Plant Pathol, ZA-9300 Bloemfontein, South Africa
关键词
leaf rust; Lr29; Lr34; Lr; 35; Lr37; Puccina triticina; quality; Triticum aestivum; wheat;
D O I
10.1023/A:1015683216948
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
Leaf rust, caused by Puccinia triticina, is considered one of the most important diseases of wheat. In South Africa the genes Lr29, Lr34, Lr35 and Lr37 confer effective resistance to leaf rust, qualifying them for use in cultivar improvement. To study possible secondary effects of these genes, a collection of BC6 lines containing each of the genes singly, was evaluated for breadmaking quality. The recurrent parent Karee, and Thatcher NILs used as resistance donors in the primary crosses, as well as Thatcher, were included as checks. The presence of Lr29, Lr34, Lr35 and Lr37 caused a significant increase in flour protein and water absorption. For most of the other characteristics the NILs performed statistically similar to the recurrent parent. Some sib lines performed significantly better than others, emphasising the value of selecting for improved quality among backcross lines.
引用
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页码:65 / 70
页数:6
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