Growth rate reduction in self-limiting growth of doped GaAs by molecular layer epitaxy

被引:4
|
作者
Nishizawa, J [1 ]
Kurabayashi, T [1 ]
Plotka, P [1 ]
Kikuchi, H [1 ]
Hamano, T [1 ]
机构
[1] Semicond Res Inst Semicond Res Fdn, Aoba Ku, Sendai, Miyagi 9800862, Japan
关键词
adsorption; doping; surface processes; atomic layer epitaxy; GaAs;
D O I
10.1016/j.mssp.2003.08.021
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Self-limiting growth of GaAs with doping by molecular layer epitaxy (MLE) has been studied using the intermittent supply of TEG, AsH3, and a dopant precursor, Te(C2H5)(2) (diethyl-tellurium: DETe) for n-type growth on GaAs (001). The self-limiting monolayer growth is applicable at 265degreesC, however, the growth rate per cycle of doping decreased and saturated at about 0.4 monolayer with increasing doping concentration. To clarify the mechanism of growth with doping and to solve the problem of the growth rate reduction, a doping cycle followed by several cycles of undoped growth was performed. The growth rate reduction in the TEG-AsH3 system is due to the electrical characteristics of the growing surface, namely, the exchange reaction of TEG is reduced with increasing doping concentration. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:429 / 431
页数:3
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