Reproducible and reliable resistive switching behaviors of AlOX/HfOX bilayer structures with Al electrode by atomic layer deposition

被引：55

作者：

Akbari, Masoud ^{[1
]}

Kim, Min-Kyu ^{[1
]}

Kim, Dongshin ^{[1
]}

Lee, Jang-Sik ^{[1
]}

机构：

[1] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 790784, South Korea

来源：

RSC ADVANCES | 2017年 / 7卷 / 27期

基金：

新加坡国家研究基金会;

关键词：

IMPROVEMENT; UNIFORMITY; FILMS;

D O I：

10.1039/c6ra26872b

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The resistive switching behaviors of AlOX/HfOX bilayer structures were investigated. Metal oxides were deposited by atomic layer deposition. Al and Pt were used as top and bottom electrodes, respectively. Compared with AlOX and HfOX monolayer structures, the bilayer structure showed lower set/reset voltages and more-uniform resistive switching properties. It also exhibited good data retention and endurance. The Al top electrode may gather oxygen ions from the oxide layer underneath and thereby create oxygen vacancies in the oxide layer. The uniform electrical property of the bilayer structure is attributed to confined formation/rupture of conductive filaments in the HfOX layer, whereas undissociated filaments in the AlOX layer nucleate rapid regeneration of filaments.

引用

页码：16704 / 16708

页数：5

共 35 条

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