Pulsed laser deposition and characterization of NiTi-based MEMS prototypes

被引:4
|
作者
Camposeo, A
Fuso, F
Allegrini, M
Arimondo, E
Tuissi, A
机构
[1] Univ Pisa, Dipartimento Fis E Fermi, INFM, I-56127 Pisa, Italy
[2] CNR, IENI, Sez Lecco, I-22053 Lecce, Italy
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2004年 / 79卷 / 4-6期
关键词
D O I
10.1007/s00339-004-2687-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report the fabrication and characterization of microelectromechanical systems (MEMS) prototypes based on a microcantilever coated with a NiTi thin film. The NiTi film was deposited by laser ablation and deposition in ultra-high vacuum. The samples were characterized from the mechanical point of view by measuring the resonance frequency of the cantilever as a function of the temperature. Data show a clear phase transition of the NiTi film, with relevant transition temperatures close to those of the bulk, which demonstrates the congruency of the deposition method. We have also developed a technique to control the deflection of the NiTi-coated cantilever by all-optical means, both continuous and pulsed, the latter with typical time scales in the hundreds of mus range.
引用
收藏
页码:1141 / 1143
页数:3
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