共 13 条
[1]
Sinusoidal wavelength-scanning interferometer using an acousto-optic tunable filter for measurement of thickness and surface profile of a thin film
[J].
OPTICS EXPRESS,
2005, 13 (25)
:10066-10074
[5]
CONTOURING ASPHERIC SURFACES USING 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY
[J].
OPTICA ACTA,
1985, 32 (12)
:1455-1464
[9]
Peter J. de G., 1994, APPL OPTICS, V33, P5948