Determination of deep and shallow levels in conjugated polymers by electrical methods

被引：13
|
作者：
Stallinga, P
Gomes, HL
Rost, H
Holmes, AB
Harrison, MG
Friend, RH
Biscarini, F
Taliani, C
Jones, GW
Taylor, DM
机构：
[1] Univ Algarve, Unidad Ciencias Exactas & Humanas, P-8000 Faro, Portugal
[2] Melville Lab Polymer Synth, Cambridge CB2 3RA, England
[3] Univ Cambridge, Cavendish Lab, Cambridge CB3 OHE, England
[4] CNR, Ist Spettroscopia Mol, I-40129 Bologna, Italy
[5] Univ Coll N Wales, Inst Mol & Biomol Elect, Bangor LL57 1UT, Gwynedd, Wales
来源：
PHYSICA B-CONDENSED MATTER | 1999年 / 273-4卷
关键词：
organic semiconductors; electrical characterization;
D O I：
10.1016/S0921-4526(99)00555-4
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-methylthiophene) (PMeT), and alpha-sexithienyl (alpha T6) and the employed techniques were IV, CV, admittance spectroscopy, TSC, capacitance and current transients. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：923 / 926
页数：4
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