共 10 条
[2]
Position Control in Lithographic Equipment An Enabler for Current-Day Chip Manufacturing
[J].
IEEE CONTROL SYSTEMS MAGAZINE,
2011, 31 (05)
:28-47
[3]
Cui Jiefan, 2009, Proceedings of the 2009 Sixth International Conference on Fuzzy Systems and Knowledge Discovery (FSKD 2009), P112, DOI 10.1109/FSKD.2009.41
[6]
Lan Y., 2017, INT J MACH LEARN CYB, P1
[7]
LEANG S, 1992, IEEE / SEMI INTERNATIONAL SEMICONDUCTOR MANUFACTURING SCIENCE SYMPOSIUM, P79, DOI 10.1109/ISMSS.1992.197641
[8]
Design and control of optimal scan trajectories: Scanning tunneling microscope example
[J].
JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME,
2004, 126 (01)
:187-197
[10]
Wang ZH, 2015, P AMER CONTR CONF, P3558, DOI 10.1109/ACC.2015.7171882