Multiple-discriminant analysis for light-scattering spectroscopy and imaging of two-layered tissue phantoms

被引:12
作者
Gono, K
Igarashi, M
Obi, T
Yamaguchi, M
机构
[1] Olympus Co, Hachioji, Tokyo 1928507, Japan
[2] Tokyo Inst Technol, Sci & Engn Lab, Midori Ku, Yokohama, Kanagawa 2268503, Japan
[3] Tokyo Inst Technol, Frontier Collaborat Res Ctr, Midori Ku, Yokohama, Kanagawa 2268503, Japan
关键词
D O I
10.1364/OL.29.000971
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a new method for enhancing the sensitivity of the reflectance spectrum to the scattering feature of the superficial tissue layer. This method is based on multiple-discriminant analysis in the eigensubspace of the spectrum. Considering the application of scattering imaging, we evaluated this method by performing multispectral imaging of two-layered tissue phantoms. A color map converted from the spectral reflectance corresponds well to variations in the size of the scattering in the first layer. (C) 2004 Optical Society of America.
引用
收藏
页码:971 / 973
页数:3
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