Combined PIXE and XPS analysis on republican and imperial Roman coins

被引：23
作者：
Daccà, A
Prati, P
Zucchiatti, A
Lucarelli, F
Mandò, PA
Gemme, G
Parodi, R
Pera, R
机构：
[1] Univ Genoa, Dipartimento Fis, I-16146 Genoa, Italy
[2] Univ Genoa, Ist Nazl Fis Nucl, I-16146 Genoa, Italy
[3] Univ Florence, Dipartimento Fis, I-50125 Florence, Italy
[4] Ist Nazl Fis Nucl, I-50125 Florence, Italy
[5] Univ Genoa, DISAMANT, I-16126 Genoa, Italy
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2000年 / 161卷
关键词：
archaeometry; PIXE; XPS; Roman coins;
D O I：
10.1016/S0168-583X(99)00965-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A combined PIXE and XPS analysis has been performed on a few Roman coins of the republican and imperial age. The purpose was to investigate via XPS the nature and extent of patina in order to be capable of extracting PIXE data relative to the coins bulk. The inclusion of elements from the surface layer, altered by oxidation and inclusion, is a known source of uncertainty in PIXE analyses of coins, performed to assess the composition and the provenance. (C) 2000 Elsevier Science B.V. All rights reserved.
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页码：743 / 747
页数：5
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