Voltage distribution in a two-component random system

被引:7
作者
Kolek, A
机构
[1] Department of Electrical Engineering, Rzeszów University of Technology, 35-959 Rzeszów
来源
PHYSICAL REVIEW B | 1996年 / 53卷 / 21期
关键词
D O I
10.1103/PhysRevB.53.14185
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A disordered medium composed of randomly arranged metal and insulator, both with finite conductance, is considered. The distribution of voltage drops upsilon in such two-component random system has been calculated both analytically and numerically. It is shown that the distribution N(y) of the logarithm of voltage drops, y=-ln(upsilon(2)), is the sum of several members, N-ck(y) and N-ik(y), k=0,1,2,....Members N-ck(y) describe the voltage distribution in the metallic phase. Members N-ik(y) describe the voltage distribution in the insulating component. The subsequent members are shifted subsequently on the y axis by an amount of 2k ln(hL(1/(nu phi))), where phi is the crossover exponent and nu is the percolation correlation length exponent. The zero-order member of the N-ck family is governed by the multifractal spectrum f(alpha), where alpha=y/lnL, found originally for the random resistor network. The zero-order member of the N-ik family is governed by the multifractal spectrum phi(alpha) found originally for the random resistor superconductor network. The next members are built from two components. The first one is the scaled repetition of N-c0 for the N-ck family or N-i0 for the N-ik family. The other one is the distribution of voltage drops in such percolation objects like dangling ends, isolated clusters for the N-ck family or clusters perimeter for the N-ik family.
引用
收藏
页码:14185 / 14195
页数:11
相关论文
共 46 条
  • [31] 1/F NOISE IN RANDOM RESISTOR NETWORKS - FRACTALS AND PERCOLATING SYSTEMS
    RAMMAL, R
    TANNOUS, C
    TREMBLAY, AMS
    [J]. PHYSICAL REVIEW A, 1985, 31 (04): : 2662 - 2671
  • [32] FLICKER (1-F) NOISE IN PERCOLATION NETWORKS - A NEW HIERARCHY OF EXPONENTS
    RAMMAL, R
    TANNOUS, C
    BRETON, P
    TREMBLAY, AMS
    [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (15) : 1718 - 1721
  • [33] OFF-THRESHOLD MULTIFRACTALITY IN PERCOLATION
    ROUX, S
    HANSEN, A
    [J]. EUROPHYSICS LETTERS, 1989, 8 (08): : 729 - 734
  • [34] PERCOLATION STRUCTURE MODEL IN THE SMEARING REGION
    SNARSKII, AA
    MOROZOVSKY, AE
    [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1995, 78 (01) : 135 - 137
  • [35] SNARSKII AA, COMMUNICATION
  • [36] CRITICAL PHENOMENA IN RESISTOR NETWORKS
    STRALEY, JP
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1976, 9 (05): : 783 - 795
  • [37] CURRENT DISTRIBUTION IN RANDOM RESISTOR NETWORKS
    STRALEY, JP
    [J]. PHYSICAL REVIEW B, 1989, 39 (07): : 4531 - 4535
  • [38] POSITION-SPACE RENORMALIZATION METHOD AND THE EXPONENT THEORY OF RANDOM CONDUCTORS
    STRALEY, JP
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (18): : 3711 - 3716
  • [39] HOW MANY CORRELATION LENGTHS FOR MULTIFRACTALS
    TREMBLAY, AMS
    TREMBLAY, RR
    ALBINET, G
    FOURCADE, B
    [J]. PHYSICA A, 1992, 183 (04): : 398 - 410
  • [40] NOISE AND CROSSOVER EXPONENT IN THE 2-COMPONENT RANDOM RESISTOR NETWORK
    TREMBLAY, RR
    ALBINET, G
    TREMBLAY, AMS
    [J]. PHYSICAL REVIEW B, 1991, 43 (13): : 11546 - 11549