Friction tracks on diamond surfaces imaged by atomic force microscopy

被引:6
作者
Couto, MS
vanEnckevort, WJP
Seal, M
机构
[1] CATHOLIC UNIV NIJMEGEN, FAC SCI, DEPT SOLID STATE CHEM, NL-6525 ED NIJMEGEN, NETHERLANDS
[2] SIGILLUM BV, NL-1077 WN AMSTERDAM, NETHERLANDS
关键词
atomic force microscopy; surface structure; friction tracks; diamond polishing;
D O I
10.1016/S0925-9635(97)00009-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The friction tracks produced by spherical diamond styli sliding on a planar diamond face along a soft direction for polishing have been imaged by atomic force microscopy. The tracks produced by a single pass as well as by multiple passes of the stylus show the presence of many individual smooth grooves, which are only a few atom layers deep. Debris formed during the sliding process was always found along the paths. The tracks produced at high loads show the presence of ring cracks as well as grooves. The morphology of the grooves indicates that wear is a process during which atoms are removed individually or in small groups. Implications for understanding the mechanism of diamond perishing are discussed. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:975 / 982
页数:8
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