TEM studies of the nitrided Ni-Ti surface layer

被引:9
作者
Lelatko, J. [1 ]
Paczkowski, P.
Wierzchon, T.
Morawiec, H.
机构
[1] Silesian Univ, Inst Sci Mat, Katowice, Poland
[2] Warsaw Univ Technol, Fac Mat Sci & Engn, Warsaw, Poland
来源
JOURNAL OF MICROSCOPY-OXFORD | 2006年 / 223卷
关键词
electron microscopy; Ni-Ti alloy; nitride layers;
D O I
10.1111/j.1365-2818.2006.01628.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
The structure of surface layer, obtained on the nearly equiatomic Ni-Ti alloy after nitriding under glow discharge conditions at temperatures 700 or 800 degrees C, was investigated. The structural characterization of the intruded layer was performed on cross-sectional thin foils by the use of the transmission and scanning electron microscopes. The obtained results show that the nitrided layers consist mainly of the nanocrystalline TiN phase and small amount of Ti2N. Between the nitrided layers and beta-NiTi matrix an intermediate Ti2Ni phase layer was observed.
引用
收藏
页码:234 / 236
页数:3
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