High-resolution-electron-microscopy investigation of nanosize inclusions

被引：7

作者：

Dahmen, U ^{[1
]}

Johnson, E ^{[1
]}

Xiao, SQ ^{[1
]}

Johansen, A ^{[1
]}

机构：

[1] UNIV COPENHAGEN,NIELS BOHR INST,ORSTED LAB,DK-1168 COPENHAGEN,DENMARK

来源：

MRS BULLETIN | 1997年 / 22卷 / 08期

关键词：

D O I：

10.1557/S0883769400033819

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：49 / 52

页数：4

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